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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems true
By:Eishi H. Ibe
Published on 2014-11-26 by John Wiley & Sons


This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms Covers both terrestrial and avionic-level conditions Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary Written by a widely-recognized authority in soft-errors in electronic devices Code samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.

This Book was ranked at 17 by Google Books for keyword Single Board Computers.

Book ID of Terrestrial Radiation Effects in ULSI Devices and Electronic Systems's Books is LxYIBgAAQBAJ, Book which was written byEishi H. Ibehave ETAG "W4hjwrowdiw"

Book which was published by John Wiley & Sons since 2014-11-26 have ISBNs, ISBN 13 Code is 9781118479322 and ISBN 10 Code is 1118479327

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Book which have "296 Pages" is Printed at BOOK under CategoryTechnology and Engineering

Book was written in en

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